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RCME0256200FYS03

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SN74BCT8374ADWRG4

SN74BCT8374ADWRG4

IC SCAN TEST DEVICE 24SOIC

SN74BCT8374ADWRG4

SN74BCT8374ADWRG4

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Part No :

SN74BCT8374ADWRG4

Manufacturer
Texas Instruments
Description
IC SCAN TEST DEVICE 24SOIC
Catalog
Logic - Specialty Logic
Availability
201520 pieces
Shipped from
HK warehouse
Expected Shipping Date
Feb 28 - Mar 04 2025
Type Description
Series:74BCT
Package:Tape & Reel (TR)
Part Status:Obsolete
Logic Type:Scan Test Device with D-Type Edge-Triggered Flip-Flops
Supply Voltage:4.5V ~ 5.5V
Number of Bits:8
Operating Temperature:0°C ~ 70°C
Mounting Type:Surface Mount
Package / Case:24-SOIC (0.295", 7.50mm Width)
Supplier Device Package:24-SOIC
SN74BCT8374ADWRG4 is available at GangBo-ic.com, Please review product page below for detailed information, including SN74BCT8374ADWRG4 price, datasheets, in-stock availability, technical difficulties. Quickly Enter the access of compare list to find replaceable electronic parts. Want to gain comprehensive data for SN74BCT8374ADWRG4 to optimize the supply chain (include cross references, lifecycle, parametric, counterfeit risk, obsolescence management forecasts), please contact to our Tech-supports team.

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