IC SCAN TEST DEVICE BUFF 24-DIP
Type | Description |
---|---|
Series: | 74BCT |
Package: | Tube |
Part Status: | Obsolete |
Logic Type: | Scan Test Device with Buffers |
Supply Voltage: | 4.5V ~ 5.5V |
Number of Bits: | 8 |
Operating Temperature: | 0°C ~ 70°C |
Mounting Type: | Through Hole |
Package / Case: | 24-DIP (0.300", 7.62mm) |
Supplier Device Package: | 24-PDIP |
UNIT2, 22/F., RICHMOND COMM. BLDG., 109 ARGYLE STREET, MONGKOK, KOWLOON, HK
Office Hours : Mon-Fri, 9:00-18:30(GMT+8)
Phone: 00852-52612101
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